XUV光谱仪

XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 qAUaF;{  
    单光栅（标准配置）可覆盖5-80nm测量范围 tW:W&|q  
技术参数

d>^~9X   波长范围	i Bi7|   5-20	_TZW|Dh-2F   10-60	y!S^xS   25-80
|*%/ovg+   光源距离（m）	D4AEZgC F,	zTkFX67)   0.4-0.6	6eD(dZ   0.5-1.5
?$<SCN=   平场尺寸（mm）	K{|w 43>D   25.4	W=~id"XtJ   50	L5R `w&Up   50
_mw13jcN]   色散(nm/mm)	3|q2rA   0.5-0.7	&K06}[J   0.7-1.1	U!x0,sr   0.9-1.3
"=9-i-K9B   光谱分辨率（nm）	P\.WXe#j   0.06	O-i4_YdVt   0.09	<"N:rn{Qq   0.11
	U%Dit   0.02（CCD探测器）
l<$rqz3D   升级波长范围	DD2adu^   可拓展至1-5nm(搭配该范围光栅)
lrCm9Oy   探测器选择	'^hsH1   X-Ray 相机，MCP探测器，fiber taper系统
)r=9]0=   光栅台	Z#CxQ D%\   电控
{":c@I   工作环境	M#`{>R|   <10-6mbar
>+L7k^[,0   操作性	aZP2 R"   极易安装使用，用户自己即可安装使用

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技术优势介绍： P_Z M'[  
- Direct imaging of the source / Superior signal strength In contrast to conventional devices our XUV spectrometer does not require a narrow entrance aperture but rather images the harmonic source directly onto the detector. Thus 80% or more of the incoming beam can be used for measurement. Please see T&]Na  
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. xf'LR[M  
This configuration typically collects 15 to 25 times more light than standard versions, resulting in a signal-to-noise figure improved by the -48`#"xy  
same ratio. YmOldR9v(  
In some experiments, this improved signal strength is the crucial step for realizing a measurement at all. n4Vwao/9x  
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- Flat-field imaging technology 8IeI0f"l)  
Our instruments are based on high quality aberration-corrected flat-field gratings. In contrast to conventional gratings these focus all wavelengths onto a plane rather than a circle. This allows for positioning the entire detector in the focal plane of the grating for superior spectral resolution.
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- Compactness / Modularity ebzzzmwo  
The spectrometer is very compact and can be bolted directly to a vacuum chamber. It is capable of carrying its own weight, no table required. p*Xix%#6  
There are no externally moving parts. 87pnSj/X"  
Through its modular design, our spectrometer can be adapted to a number of configurations (source distance, spectral range, detectors, vacuum ]Z=Ij gr$  
pumping, etc). This makes it highly flexible for varying requirements and experiments. >#INEO  
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- Robust against misalignment b)d^ `J  
The compact design of the spectrometer makes it inherently insensitive against mechanical and environmental disturbances (vibrations, ~H7!MC~K  
acoustics, etc). No externally moving parts and closed-loop grating actuators with absolute position monitoring add to the robustness and vlvvi()  
allow for monitoring of the grating alignment at all times. _wmI(+_  
In addition, the concept of a spectrometer without entrance slit also makes the instrument less sensitive to misalignment. Under typical <o2,HTWNPS  
operating conditions a misalignment of the beam in the dispersion direction on the entrance of the spectrometer by 500um would lead to a w"1x=+  
signal reduction by more than 20% in an instrument with entrance slit while it is less than 10% for our design. kY=rz&?U  
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- Customization |hc\jb  
The adaptability of our XUV spectrometer makes it possible to highly custom-fit the device to requirements. Thus we offer to customize every axtb<5&  
spectrometer to exactly match the desired research application. This includes e.g. interfacing to experimental chambers, adaption of the *-6?  
source distance, integration of customer-supplied detectors, user-defined filter mounts, non-magnetic instruments, special mounting M%3Wy"YQ,n  
situations, etc. >G&^?5  
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典型客户： ?HV}mS[t  
1） 苏黎世联邦理工学院 \Yd4gaY\o  
2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) +^Fp&K+^  
3） MPQ 7N| AA^I  
4） Los Alamos pziq
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5） Max Planck Institute X~Cq  
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上海达灿光电科技有限公司 ,[Ag~.T  
021-60450828 7|Xe&o<n