XUV光谱仪

XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 N 3c*S"1  
    单光栅（标准配置）可覆盖5-80nm测量范围 <T
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技术参数

R!,)?j;   波长范围	7 L\?   5-20	6hK"k   10-60	gpWS_Dw9   25-80
@E2nF|N   光源距离（m）	]Qr8wa>Z	YkPt*?,P/   0.4-0.6	DZRxp,   0.5-1.5
c!Vc_@V,   平场尺寸（mm）	'.yWL   25.4	MF}Lv1/[-J   50	Xb*_LZAU   50
,d>~='   色散(nm/mm)	|vz;bJG   0.5-0.7	"S`wwl   0.7-1.1	--`LP[l l   0.9-1.3
:, [!8QP   光谱分辨率（nm）	+3>/,w(x   0.06	; ZV^e   0.09	3 ?F@jEQk   0.11
	"v!HKnDT   0.02（CCD探测器）
"NH+qQhs   升级波长范围	~q(C j"7   可拓展至1-5nm(搭配该范围光栅)
R"gm]SQ/   探测器选择	ZHlin#"   X-Ray 相机，MCP探测器，fiber taper系统
Z(mn U;9{v   光栅台	.oj"ru   电控
y=xe<#L   工作环境	&6=ZT:.6Te   <10-6mbar
}]+}Tipd   操作性	K)UOx#xe1   极易安装使用，用户自己即可安装使用

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技术优势介绍： P=[x!}.I  
- Direct imaging of the source / Superior signal strength In contrast to conventional devices our XUV spectrometer does not require a narrow entrance aperture but rather images the harmonic source directly onto the detector. Thus 80% or more of the incoming beam can be used for measurement. Please see jjT2k  
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. dG>Wu o  
This configuration typically collects 15 to 25 times more light than standard versions, resulting in a signal-to-noise figure improved by the C$G88hesn  
same ratio. -!G#")<  
In some experiments, this improved signal strength is the crucial step for realizing a measurement at all. L_ qv<iM$  
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- Flat-field imaging technology W?J*9XQ`  
Our instruments are based on high quality aberration-corrected flat-field gratings. In contrast to conventional gratings these focus all wavelengths onto a plane rather than a circle. This allows for positioning the entire detector in the focal plane of the grating for superior spectral resolution. e=;@L3f
 
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- Compactness / Modularity dzNaow*0&V  
The spectrometer is very compact and can be bolted directly to a vacuum chamber. It is capable of carrying its own weight, no table required. Rn(F#tI  
There are no externally moving parts. zw0 r i6  
Through its modular design, our spectrometer can be adapted to a number of configurations (source distance, spectral range, detectors, vacuum n;^k
 
pumping, etc). This makes it highly flexible for varying requirements and experiments. , gr&s+  
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- Robust against misalignment A;j$rGx  
The compact design of the spectrometer makes it inherently insensitive against mechanical and environmental disturbances (vibrations, *5'6E'  
acoustics, etc). No externally moving parts and closed-loop grating actuators with absolute position monitoring add to the robustness and k=~pA iRDN  
allow for monitoring of the grating alignment at all times. h9w^7MbO  
In addition, the concept of a spectrometer without entrance slit also makes the instrument less sensitive to misalignment. Under typical )7"DR+;:  
operating conditions a misalignment of the beam in the dispersion direction on the entrance of the spectrometer by 500um would lead to a &R FM d=  
signal reduction by more than 20% in an instrument with entrance slit while it is less than 10% for our design. us,,W(q  
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- Customization \3(|c#c  
The adaptability of our XUV spectrometer makes it possible to highly custom-fit the device to requirements. Thus we offer to customize every ?CW^*So  
spectrometer to exactly match the desired research application. This includes e.g. interfacing to experimental chambers, adaption of the dms:i)L2  
source distance, integration of customer-supplied detectors, user-defined filter mounts, non-magnetic instruments, special mounting h:Mn$VR,  
situations, etc. b:5%}  
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典型客户： Nw$[a$^n  
1） 苏黎世联邦理工学院 OK2/k_jXN'  
2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) 9q)nNX<$)  
3） MPQ q{Ta?|x#  
4） Los Alamos ]V769B
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5） Max Planck Institute A"<)(M+kG  
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上海达灿光电科技有限公司 ]7R&m)1
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021-60450828 tqwk?[y}+l