Outline of the contents: j;s"q]"x]
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1. Basic Interferometers for Optical Testing d@ Y}SW TB
2. Phase-Shifting Interferometry H,+I2 tEs
3. Specialized Optical Tests XEn *?.e
4. Long Wavelength Interferometry I?"q/Ub~h
5. Testing of Aspheric Surfaces e_s &L,ze
6. Measurement of Surface Microstructure #[zI5)Me h
7. Absolute Measurements \]P!.}nX#
8. Concluding Remarks
