如果採用 Code V 軟體,那麼可以用 SAGF 函數計算面深(Sag)量: PRT +mT
SAGF(surface_num, zoom_pos, x_coord, y_coord) - Sag of the designated surface at x_coord, y_coord Vz[C=_m
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如果想知道的是某一非球面的型狀是否能由干涉儀測量,那麼 Code V 提供兩個函數: "ITIhnE
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(1) 使用 Zygo 干涉儀 aN=B]{!
函數 @VFA(zoom #, surface #, height) GJUL$9
Surface is testable for @VFA < 1.0 -{_PuJ "
Surface is not testable for @VFA > 1.0 !%>7Dw(kt
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(2)使用 QED 干涉儀 59-c<I/}f
函數 @SSIa(surface #, zoom #, height) J.
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0 <= @SSIa < 0.5 - surface is readily testable XZwK6F)L
0.5 <= @SSIa < 1 - surface is marginally testable BluVmM3Vj
@SSIa >= 1 - surface is difficult to test