| 谈谈光电子 |
2014-11-15 19:16 |
XUV光谱仪
XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 dY 8 H2;
单光栅（标准配置）可覆盖5-80nm测量范围 'S`l[L:.8
技术参数 UC`h o%OBF
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技术优势介绍： |8 ` }8vo)
- Direct imaging of the source / Superior signal strength In contrast to conventional devices our XUV spectrometer does not require a narrow entrance aperture but rather images the harmonic source directly onto the detector. Thus 80% or more of the incoming beam can be used for measurement. Please see f^pBXz9&=
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. k4{!h?h
This configuration typically collects 15 to 25 times more light than standard versions, resulting in a signal-to-noise figure improved by the xlv(PVdn
same ratio. ZF>:m>
In some experiments, this improved signal strength is the crucial step for realizing a measurement at all. S{^x]h|?
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- Flat-field imaging technology b7.7@Ly
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Our instruments are based on high quality aberration-corrected flat-field gratings. In contrast to conventional gratings these focus all wavelengths onto a plane rather than a circle. This allows for positioning the entire detector in the focal plane of the grating for superior spectral resolution. ka_m
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- Compactness / Modularity r_+Vb* |Y
The spectrometer is very compact and can be bolted directly to a vacuum chamber. It is capable of carrying its own weight, no table required. ]
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There are no externally moving parts. @X/ 1`Mp
Through its modular design, our spectrometer can be adapted to a number of configurations (source distance, spectral range, detectors, vacuum B-
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pumping, etc). This makes it highly flexible for varying requirements and experiments. wDvu2iC=
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- Robust against misalignment Z_ GGH2u
The compact design of the spectrometer makes it inherently insensitive against mechanical and environmental disturbances (vibrations, p A8bFtt
acoustics, etc). No externally moving parts and closed-loop grating actuators with absolute position monitoring add to the robustness and ]!ai?z%cK#
allow for monitoring of the grating alignment at all times. 4Sh8w%s
In addition, the concept of a spectrometer without entrance slit also makes the instrument less sensitive to misalignment. Under typical 4)iP%%JH
operating conditions a misalignment of the beam in the dispersion direction on the entrance of the spectrometer by 500um would lead to a Kw-< o!~
signal reduction by more than 20% in an instrument with entrance slit while it is less than 10% for our design. #$UwJ B]_D
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- Customization ;1&"]N%
The adaptability of our XUV spectrometer makes it possible to highly custom-fit the device to requirements. Thus we offer to customize every {IOc'W-C#2
spectrometer to exactly match the desired research application. This includes e.g. interfacing to experimental chambers, adaption of the P%R!\i
source distance, integration of customer-supplied detectors, user-defined filter mounts, non-magnetic instruments, special mounting Ou[`)|>
situations, etc. S(.J
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典型客户： A ;8kC}
1） 苏黎世联邦理工学院 5WI
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2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) %U{6 `m
3） MPQ / =9Y(v
4） Los Alamos #?)6^uTW
5） Max Planck Institute ;bwBd :Y
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上海达灿光电科技有限公司 & %/p; ::A
021-60450828 {XU!p: x
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