| 谈谈光电子 |
2014-11-15 19:16 |
XUV光谱仪
XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 xQJdt $]U@
单光栅（标准配置）可覆盖5-80nm测量范围 B~~rLo: a
技术参数 {OQ sGyR?
• ];Z_S`JR
技术优势介绍： R\X=V g
- Direct imaging of the source / Superior signal strength In contrast to conventional devices our XUV spectrometer does not require a narrow entrance aperture but rather images the harmonic source directly onto the detector. Thus 80% or more of the incoming beam can be used for measurement. Please see ,
:kCt=4%
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. QR^pu.k@
This configuration typically collects 15 to 25 times more light than standard versions, resulting in a signal-to-noise figure improved by the N*o+m ~:y
same ratio. <vbk@d
In some experiments, this improved signal strength is the crucial step for realizing a measurement at all. ^{Mx?]z
,~G[\2~p
- Flat-field imaging technology $ ]%k
<| X
Our instruments are based on high quality aberration-corrected flat-field gratings. In contrast to conventional gratings these focus all wavelengths onto a plane rather than a circle. This allows for positioning the entire detector in the focal plane of the grating for superior spectral resolution. \3Xt\1qN4
FiFZM
- Compactness / Modularity A
7TP 1
The spectrometer is very compact and can be bolted directly to a vacuum chamber. It is capable of carrying its own weight, no table required. lUWjm%|
There are no externally moving parts. K$K[fcj
Through its modular design, our spectrometer can be adapted to a number of configurations (source distance, spectral range, detectors, vacuum wV(_=LF
pumping, etc). This makes it highly flexible for varying requirements and experiments. 6o6m" 6
BKJ W\gS2
- Robust against misalignment I:Z38xz -[
The compact design of the spectrometer makes it inherently insensitive against mechanical and environmental disturbances (vibrations, Q0M8 }
acoustics, etc). No externally moving parts and closed-loop grating actuators with absolute position monitoring add to the robustness and tc#
rL
allow for monitoring of the grating alignment at all times. K,^b=_]
In addition, the concept of a spectrometer without entrance slit also makes the instrument less sensitive to misalignment. Under typical ,,,5pCi\
operating conditions a misalignment of the beam in the dispersion direction on the entrance of the spectrometer by 500um would lead to a qnT:x{o
signal reduction by more than 20% in an instrument with entrance slit while it is less than 10% for our design. w#"c5w~
V: IoeQ]-
- Customization ,',fO?Qv'
The adaptability of our XUV spectrometer makes it possible to highly custom-fit the device to requirements. Thus we offer to customize every V:l; 2rW
spectrometer to exactly match the desired research application. This includes e.g. interfacing to experimental chambers, adaption of the }*+ca>K
source distance, integration of customer-supplied detectors, user-defined filter mounts, non-magnetic instruments, special mounting 4\-kzGgmo
situations, etc. 2>s:wABb /
f#5mX&j
典型客户： \WZ00Y,*
1） 苏黎世联邦理工学院 Ho\z ^w+T`
2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) 8
A2k-X,
3） MPQ 1_<'S34
4） Los Alamos ^ mG-O
5） Max Planck Institute a0. )zgWr
#>!!#e!*
上海达灿光电科技有限公司 I-+D+DhRx
021-60450828 N!btj,vx
|
|