| 谈谈光电子 |
2014-11-02 18:37 |
XUV光谱仪
XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 9L'R;H?L
单光栅（标准配置）可覆盖5-80nm测量范围 niV= Ijt{5
技术参数 0SXWt? }
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技术优势介绍： ; 9pOtr
- Direct imaging of the source / Superior signal strength c_]$UM[7L
In contrast to conventional devices our XUV spectrometer does not ^<R*7mB*
require a narrow entrance aperture but rather images the harmonic source $Blo` '
directly onto the detector. Thus 80% or more of the incoming beam can be )A a98Eu?2
used for measurement. Please see n_%JXm#\
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. m Kwhd} V
This configuration typically collects 15 to 25 times more light than Eoug/we
standard versions, resulting in a signal-to-noise figure improved by the X 5 LI
same ratio. 2yhtJ9/
In some experiments, this improved signal strength is the crucial step 1q*85 [Y
for realizing a measurement at all. rHu #
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- Flat-field imaging technology 1o 7
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Our instruments are based on high quality aberration-corrected t+k"$zR
flat-field gratings. In contrast to conventional gratings these focus W;coi4
all wavelengths onto a plane rather than a circle. This allows for UB]} j^
positioning the entire detector in the focal plane of the grating for c xdhG "
superior spectral resolution. A\Q]o#U
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- Compactness / Modularity @4 m_\]Wy
The spectrometer is very compact and can be bolted directly to a vacuum Ep0L51Q
chamber. It is capable of carrying its own weight, no table required. & E$jAqc
There are no externally moving parts. >A|6 kzC
Through its modular design, our spectrometer can be adapted to a number 8@|_];9#.
of configurations (source distance, spectral range, detectors, vacuum 9}Tf9>qP>M
pumping, etc). This makes it highly flexible for varying requirements XB-pOtVm
and experiments. FS r`Y
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- Robust against misalignment x2.G1
The compact design of the spectrometer makes it inherently insensitive ;8;nY6Ie
against mechanical and environmental disturbances (vibrations, W|3XD-v @
acoustics, etc). No externally moving parts and closed-loop grating S=^yJ6 xJ
actuators with absolute position monitoring add to the robustness and !m rB+<:
allow for monitoring of the grating alignment at all times. 3uCC _Am
In addition, the concept of a spectrometer without entrance slit also Z mF}pa,gd
makes the instrument less sensitive to misalignment. Under typical dRyK'Xr
operating conditions a misalignment of the beam in the dispersion mCe,(/>l+
direction on the entrance of the spectrometer by 500um would lead to a .e5GJAW~9
signal reduction by more than 20% in an instrument with entrance slit X~U vh 8O
while it is less than 10% for our design. _/ZIDIn
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- Customization A?q[C4-BO,
The adaptability of our XUV spectrometer makes it possible to highly u# ?K/sU
custom-fit the device to requirements. Thus we offer to customize every za' Eom-<u
spectrometer to exactly match the desired research application. This D {h1 "q
includes e.g. interfacing to experimental chambers, adaption of the `!DrB08A
source distance, integration of customer-supplied detectors, |cJyP9}n
user-defined filter mounts, non-magnetic instruments, special mounting C<2vuZD
situations, etc. cu]2`DF
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典型客户： 8HdmG{7.
1） 苏黎世联邦理工学院 ZebXcT ,41
2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) |uQJMf[L)
3） MPQ 1b
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4） Los Alamos C',D"
5） Max Planck Institute \&]'GsfF
上海达灿光电科技有限公司 9z EO$<e o
021-60450828
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