| 谈谈光电子 |
2014-11-02 18:37 |
XUV光谱仪
XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 ~
e?af
单光栅（标准配置）可覆盖5-80nm测量范围 .
U6(>6-
技术参数 8* ?H~q~
• dEMv9"`*!
技术优势介绍： UzSDXhzObf
- Direct imaging of the source / Superior signal strength b-VQn5W
In contrast to conventional devices our XUV spectrometer does not JDa_;bqL
require a narrow entrance aperture but rather images the harmonic source on8$Kc
directly onto the detector. Thus 80% or more of the incoming beam can be 1jKj' 7/K
used for measurement. Please see OB=bRLd.IR
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. &x*l{s[
This configuration typically collects 15 to 25 times more light than 1+3-Z>^ e
standard versions, resulting in a signal-to-noise figure improved by the 6||% T$_;}
same ratio. Q:
-&
In some experiments, this improved signal strength is the crucial step kc$ W"J@
for realizing a measurement at all. lz>.mXdx
Rq2bj_ j
- Flat-field imaging technology hEo$Jz`
Our instruments are based on high quality aberration-corrected so .}W U
flat-field gratings. In contrast to conventional gratings these focus N @Ap|`Ei
all wavelengths onto a plane rather than a circle. This allows for v;z8g^L
positioning the entire detector in the focal plane of the grating for "UY34a^I
superior spectral resolution. T,/< 'cl"
rVOF
- Compactness / Modularity mV"F<G; H
The spectrometer is very compact and can be bolted directly to a vacuum KU/QEeqbrp
chamber. It is capable of carrying its own weight, no table required. hB>FJZQ_
There are no externally moving parts. &a\w+
Through its modular design, our spectrometer can be adapted to a number =7k n1G.(
of configurations (source distance, spectral range, detectors, vacuum &u aSp, L
pumping, etc). This makes it highly flexible for varying requirements leSBR,C
and experiments. qD"~5vtLqQ
@$ p6w
- Robust against misalignment TL"+Iv2]/$
The compact design of the spectrometer makes it inherently insensitive Ssir?ZUm
against mechanical and environmental disturbances (vibrations, e
:ub]1I=
acoustics, etc). No externally moving parts and closed-loop grating Xe`$SN M
actuators with absolute position monitoring add to the robustness and _a$5 "
allow for monitoring of the grating alignment at all times. iV @\v0k
In addition, the concept of a spectrometer without entrance slit also 75P!`9b E
makes the instrument less sensitive to misalignment. Under typical YGyw^$.w
operating conditions a misalignment of the beam in the dispersion GM^H
)8U
direction on the entrance of the spectrometer by 500um would lead to a t ycVcr \(
signal reduction by more than 20% in an instrument with entrance slit * >NML]#0
while it is less than 10% for our design. (IHR {m
:SMf
(E 5
- Customization ) .V,zmI
The adaptability of our XUV spectrometer makes it possible to highly &C9)%5 O)
custom-fit the device to requirements. Thus we offer to customize every $i3`cX)g
spectrometer to exactly match the desired research application. This r nMi
>?
includes e.g. interfacing to experimental chambers, adaption of the WqCER^~'>
source distance, integration of customer-supplied detectors, 5Em.sz;:8
user-defined filter mounts, non-magnetic instruments, special mounting K-.%1d@$y
situations, etc. D 7thLqA
z+0#H39 &
典型客户： PK{FQ3b2{
1） 苏黎世联邦理工学院 " K|':3n|
2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) $Mx?Y9!
3） MPQ 3$_- 0>
4） Los Alamos \\oa[nvL~
5） Max Planck Institute o {q8An)
上海达灿光电科技有限公司 :<
]sJf N
021-60450828
|
|