| 谈谈光电子 |
2014-11-02 18:37 |
XUV光谱仪
XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 )_!t9gn*wr
单光栅（标准配置）可覆盖5-80nm测量范围 +:w 9K!31-
技术参数 $ 6atr-Pb
• 9ET2uDZpL
技术优势介绍： a?E]-Zf
- Direct imaging of the source / Superior signal strength yyxGVfr
In contrast to conventional devices our XUV spectrometer does not ;^xlDN
require a narrow entrance aperture but rather images the harmonic source ^Qz8 `1`;Z
directly onto the detector. Thus 80% or more of the incoming beam can be @5Q}o3.zA-
used for measurement. Please see NZYtA7
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. 3(%hHM7DM
This configuration typically collects 15 to 25 times more light than ^sd+s ~ xx
standard versions, resulting in a signal-to-noise figure improved by the N8 }R<3/
same ratio. K$(&Qx}
In some experiments, this improved signal strength is the crucial step <=n$oMO
for realizing a measurement at all. Wcn3\v6_
z^I"{eT8
- Flat-field imaging technology 1 9a"@WB@
Our instruments are based on high quality aberration-corrected ~}w(YQy=y
flat-field gratings. In contrast to conventional gratings these focus uF9p:FvN 8
all wavelengths onto a plane rather than a circle. This allows for Ps Qq ^/
positioning the entire detector in the focal plane of the grating for 3Gf^IV-
superior spectral resolution. //`heFuc]>
0}hN/2}&
- Compactness / Modularity J]nb;4w
The spectrometer is very compact and can be bolted directly to a vacuum F%bv
vw*(
chamber. It is capable of carrying its own weight, no table required. v>.nL(VLjP
There are no externally moving parts. fG;)wQJ
Through its modular design, our spectrometer can be adapted to a number d
/&aC#'B
of configurations (source distance, spectral range, detectors, vacuum JT&CJ&#[h
pumping, etc). This makes it highly flexible for varying requirements 75w QH*
and experiments. Q bfm*JP~
au}rS0) +
- Robust against misalignment Y }'C'PR
The compact design of the spectrometer makes it inherently insensitive \bqNjlu
against mechanical and environmental disturbances (vibrations, IyIh0B~i
acoustics, etc). No externally moving parts and closed-loop grating )-|A| 1Uo
actuators with absolute position monitoring add to the robustness and Fp+^`;j
allow for monitoring of the grating alignment at all times. v<_}Br2I[
In addition, the concept of a spectrometer without entrance slit also UP 1Y3
makes the instrument less sensitive to misalignment. Under typical D}vgX zD
operating conditions a misalignment of the beam in the dispersion }\=9l<|
direction on the entrance of the spectrometer by 500um would lead to a f(
hK>H
signal reduction by more than 20% in an instrument with entrance slit vTQ Q d@
while it is less than 10% for our design. ?c"No|@+
zA9N<0[]o
- Customization F*>:~' %
The adaptability of our XUV spectrometer makes it possible to highly 7xB#) o53
custom-fit the device to requirements. Thus we offer to customize every JM -Tp!C>
spectrometer to exactly match the desired research application. This 7!hL(k [
includes e.g. interfacing to experimental chambers, adaption of the -aLBj?N c[
source distance, integration of customer-supplied detectors, M:6H%6eT
user-defined filter mounts, non-magnetic instruments, special mounting yfiRMN"2
situations, etc. m LPQ5`_
wd~e3%JM
典型客户： WW0N"m'
1） 苏黎世联邦理工学院 X}0NeG^'O
2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) 1sYwFr 5
3） MPQ = r3Yt9
4） Los Alamos Thn-8DT
5） Max Planck Institute xO9,,w47
上海达灿光电科技有限公司 p]*$m=t0r
021-60450828
|
|