| 谈谈光电子 |
2014-11-02 18:37 |
XUV光谱仪
XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 M|-)GvR$J
单光栅（标准配置）可覆盖5-80nm测量范围 }Jw, >}
技术参数 m* ;E RK
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技术优势介绍： d3Rw!slIq
- Direct imaging of the source / Superior signal strength z~Q)/d,Ac
In contrast to conventional devices our XUV spectrometer does not OB7hlW
require a narrow entrance aperture but rather images the harmonic source b[ yiq$K/
directly onto the detector. Thus 80% or more of the incoming beam can be BHw, 4#F1;
used for measurement. Please see eQ"E
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. +RXoi2"-q@
This configuration typically collects 15 to 25 times more light than #%s#c0TX
standard versions, resulting in a signal-to-noise figure improved by the q; U,s)Uz^
same ratio. X.V~SeS
In some experiments, this improved signal strength is the crucial step _|] x2xb)
for realizing a measurement at all. &{RDM~
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- Flat-field imaging technology j9,P/K$:w
Our instruments are based on high quality aberration-corrected {t!!Uz 7
flat-field gratings. In contrast to conventional gratings these focus *kVV+H<X|b
all wavelengths onto a plane rather than a circle. This allows for AEuG v}#
positioning the entire detector in the focal plane of the grating for q =Il|Nb>
superior spectral resolution. ]~%6JJN7
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- Compactness / Modularity DJ%PWlK5
The spectrometer is very compact and can be bolted directly to a vacuum a> )f=uS
chamber. It is capable of carrying its own weight, no table required. i&k7-<
There are no externally moving parts. nd (S3rct&
Through its modular design, our spectrometer can be adapted to a number e*!kZAf
of configurations (source distance, spectral range, detectors, vacuum |M_UQQAB|
pumping, etc). This makes it highly flexible for varying requirements {^'HL
and experiments. h1{ 3njdr
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- Robust against misalignment -F92 -jBM4
The compact design of the spectrometer makes it inherently insensitive Q &t<Y^B
against mechanical and environmental disturbances (vibrations, L]Mo;kT<Q
acoustics, etc). No externally moving parts and closed-loop grating v@Ox:wl>
actuators with absolute position monitoring add to the robustness and SB7c.H,
allow for monitoring of the grating alignment at all times. y?0nI<}}HK
In addition, the concept of a spectrometer without entrance slit also &0f,~ /%Z
makes the instrument less sensitive to misalignment. Under typical v3qA":(w+(
operating conditions a misalignment of the beam in the dispersion 80;(Gt@<"
direction on the entrance of the spectrometer by 500um would lead to a &OBkevg
signal reduction by more than 20% in an instrument with entrance slit W l Sm
while it is less than 10% for our design. ZB&6<uw
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- Customization `lPf b[b
The adaptability of our XUV spectrometer makes it possible to highly $SE^S
custom-fit the device to requirements. Thus we offer to customize every 'RRE|L,
spectrometer to exactly match the desired research application. This wPl%20t
includes e.g. interfacing to experimental chambers, adaption of the x m@_IL&P
source distance, integration of customer-supplied detectors, W%)Y#C
user-defined filter mounts, non-magnetic instruments, special mounting s@DLt+ O5
situations, etc. ?rIx/>C9
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典型客户： ]:f%l
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1） 苏黎世联邦理工学院 6R5Qy]]E
2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) '{`$# @a.
3） MPQ |I|fMF2K
4） Los Alamos :@)>r9N
5） Max Planck Institute 1QJL .
上海达灿光电科技有限公司 T# )P`q
021-60450828
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