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SpotOn位敏探测系统
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newopto
2013-07-01 10:58
SpotOn位敏探测系统
SpotOn位敏探测系统
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新势力光电供应
SpotOn位敏探测系统
,光谱范围350-1100nm 、位置精度±0.1um或者光束尺寸±0.025%。该系列
位敏探测系统
用于测量:激光中心/位移/功率的测量、光学系统准直及品质控制、旋转及位移的测量、平面度及准直性的校准、振动及缺陷的监控。
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Model
Descriptions
SPOTUSB-L
Lateral effect PnP 9mm×9mm, no glass cover
SPOTUSB-N
Lateral effect PnP 10mm×10mm, with glass cover
SPOTUSB-Q
Four quadrant PnP 10mm×10mm, with 30um gap, no glass cover
SPOTUSB-U
Four quadrant PnP 10mm×10mm, with 10um gap, with glass cover
SPOTON-LA
Large aperture, 135mm×100mm, 400-800nm
Optional heads
L44
Lateral effect PnP, usable beam size<25mm
L18
Lateral effect PnP 18mm×18mm, with glass cover
L4
Lateral effect PnP 4mm×4mm, no glass cover
Optional accessories
NG4
ND filter in housing (3/4"-32 thread)
NG9
ND filter in housing (3/4"-32 thread)
NG10
ND filter in housing (3/4"-32 thread)
Hood
55mm
long, for ambient light suppression
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