shenshugce |
2010-08-19 11:12 |
翻新设备供应 资料提供!
请记住,我为您提供当前和未来的资本设备的所有需要。正如你可能知道,政府消费开支是逐年稳步增长的,开展业务10年。我们来到这里,也因为你们不断扩大,我们在这里继续为您服务。请不要犹豫,请给我们充分利用我们的知识,经验,信誉和全球市场影响力。现在的更新....让我先与我们正在寻找购买自己或为我们的客户。我们为我们自己的股票购买设备。此外,我们正在协助寻找下列设备与我们的客户。如果您要出售的这些设备,我们在收到你的细节感兴趣。请不要犹豫向我们发送您的盈余工具清单,因为我们在市场上一直在寻找机会,加入到我们的库存。 #K-O<:s=y *g'%5i1ed 需要购买 : 1D"EF <gvgr4@^yR Aixtron 2600/G3 MOCVD (GaN and GaAs configurations required) 2 jQ?-/Q8# ZI :wJU:f CHA ebeam evaporators (models 600, 1000, Mark 40, Mark 50) ygV-Fv>PQ qMqf7 . Credence TMT ASL 1000 testers SrWmV@"y 1X&scVw Denton Discovery 18 e-beam evaporator or similar n#P?JyGm1g &oVZ2.O#( Eagle Testers ( ETS 364 , ETS 200) rUB67ok* GXTjK! Emcore /Veeco D180 MOCVD systems (GaN and GaAs configurations required) caTKi8 `9f7H FEI Dual Beam FIB/SEM (Strata, Quanta or Helios will be considered) @, z4{B d\ 7OtM Hitachi FESEMs Models : S4300, S4700, S4800 W H+Sd (iO/@iw Karl Suss FC150 flip chip bonder gHvkr?Cg B]#iZ,Tp Karl Suss SB6 wafer bonder kI*f}3)Y
Es:oXA KLA 5200 Overlay tool y.Yni*xt/ $L]E<
gWrP KLA 1280SE Film Thickness measurement tool Oh1a'& >hotkMX `3 KLA CDSEM (any model and any condition considered) @A%\;oo 3SF J8 KLA HRP-220 Profiler (HRP-200 or P22 will be considered) 0)|;uW -A"0mS8L KLA SP1-TBi Particle Measurement tool @7Nc*-SM Y-"7R>^I Nanometrics Nanospec 210 or similar 0o?2Sf`L\* >$A, B Nextest Maverick PT2 Tester (any NEXTEST tester will be considered) c=:A/z{ s(Fxi|v; Nikon S204B scanner with TEL ACT 8 track /T<,vR WWIQ6EJO PECVD system (direct loading tool by STS, OXFORD or Plasmatherm/Unaxis) iS8yJRy KJ6:ZTbW Rasco SO2000, SO1100, SO1000 with QFN 3x3 body size, with Hot Temp option G"prq& 3q (]Dg;v SCI Filmtek 4000 film measurement tool B}h8c vau#?U".}> STS Multiplex ICP system (DRIE with Bosch process) |0N1]Hf q9m-d-!) Sputter Coater (Denton or similar for SEM sample coating) rgrsNr:1 X& | |