I]^>>>p$
要如何使用倾斜的detector看到不同周期的干涉条纹 ]I [~0PCSX
oQ 2$z8
这边有一个Michelson Interferometer, _]-4d_&3(
MfP)Pk5
我试着调整DETECTOR的角度, 但它记录到的影像都一样, 5?lc%,-&
7p{Pmq[
照理来说调整DETECTOR角度的话干涉条文应该会一边粗一边细周期不一, L.Qz29\
IdQ./@?
但我这里无法看到, * :O"R
gxN>q4z
请问该如何处理呢, Zge(UhZ
9<6q(]U
下面是程式 HwFX,?
3''Sx8p
--------------------------------------------------------------- $iu[-my_
SYSTEM NEW fbNzRXw
RESET Ot2o=^Ng
BDTL5N
UNITS CENTIMETERS $VuXr=f}
WAVELENGTH 632.8 NANOMETERS j,.\QwpU
3 r&
WL=632.8E-7 4f([EV[6dK
PI=4*ATAN(1) l4>^79* *
KwuucY
COATING PROPERTIES d9K8[Q5^3
0.0 0.0 'ABSORB' `ePC$Ovn
0.0 1.0 'TRANSMIT' '+`[)w
1.0 0.0 'REFLECT' fSkDD>&
0.5 0.5 'BEAM_SPLITTER' i"WYcF|
k, HC"?K
PL=100 !! Path length {FNkPX
DIA=50 !! Diameter w&q[%(G_
4J2^zx,H
SURFACE CMXF[X)%
PLANE Z 0 ELLIPSE (DIA/2) (1.414*DIA/2) 0 0 0 Ao\xse{E
OBJECT 'PELLICLE' c.ow4~>
INTERFACE COATING "BEAM_SPLITTER" AIR AIR or/gx 3
FACETS 4 4 G0E5Y;YIN$
REDEFINE COLOR 1 vADiW~^Q^
ROTATE X 45 S6TNu+2w4
:?>7Z6
!! Retro Reflector 1 [_,as
SURFACE LQ jbEYp
PLANE Z 0 ELLIPSE 2@(DIA/2) e-nA>v
OBJECT 'RETRO1_FRONT' 3v/B*M VI
INTERFACE COAT REFLECT AIR SCHOTT_BK7 \^x{NV@v42
FACETS 4 4 =p+y$
REDEFINE COLOR 1 &mwd0%4
ROTATE X -90 8xAV[i
SHIFT Y (PL) UB/> Ro
WsI`!ez;D
!! Retro Reflector 2 3Q=^&o